D06200 - SEMI D62 - Test Method for Measurement of LED Light Bar for Liquid Crystal Displays Revision:SEMI D62-0619 (Reapproved 1224) - Current it makes sense to use

it makes sense to use the same wafer support configuration when measuring TTV

in the matrices of interest

Inlet impurities must be measured by part-per-million (ppm) or part-per-billion (ppb) analytical equipment

注意: 本文書は2002年，投票によりSEMI E6の全面改訂として承認された。

org September 2002

D06200 - SEMI D62 - Test Method for Measurement of LED Light Bar for Liquid Crystal Displays Revision:SEMI D62-0619 (Reapproved 1224) - Current it makes sense to use1 Purpose 1. 1 This Standard defines measurement methods and reporting requirements for various characteristics of light emitting diode (LED) light bar for liquid crystal displays (LCDs). This Standard will be helpful to unify methodologies measurement used for electro optical and mechanical characteristics which can be used to improve the quality of integrated LED backlight units and track conformity to original design rules. 2 Scope 2. 1 This