G08700 - SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer StdPbc-0611 The concentration for each impurity/dopant

The concentration for each impurity/dopant can be obtained by application of Beer’s Law

The required specification is determined by the device and the process design

The level of agreement can vary depending on the degree of precision claimed for the moisture standard

The user might use this document to check significant performance characteristics

SEMI MF1727-1110 (Reapproved 0322)

G08700 - SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer StdPbc-0611 The concentration for each impurity/dopantThe purpose of this Document is to standardize the specification of a plastic tape frame, for a 300 mm wafer, which is used between the dicing process and the die bonding process, and for the handling and shipping of wafers. This Specification is applicable to plastic tape frames for 300 mm wafers. This Standard puts in writing the dimensions, mechanical characteristics and measurement method for the 300 mm wafer tape frame. This Standard can be used