F00700 - SEMI F7 - Test Method to Determine the Tensile Strength of Tube Fitting Connections Made of Fluorocarbon Materials Revision:SEMI F7-92 (Reapproved 0299) - Inactive single crystal polished silicon wafers

single crystal polished silicon wafers used for gallium nitride-on-silicon applications

When testing wafers

were in routine use

この作業方法では，SSISの性能を定量化するための基礎を提供する。また，SSIS性能定量化は，関連スタンダードの中で例えば感度，再現性，キャプチャレート等に影響するパラメータとして関係している。

SEMI E96-0200 (first published - replaces SEMI PR5)

F00700 - SEMI F7 - Test Method to Determine the Tensile Strength of Tube Fitting Connections Made of Fluorocarbon Materials Revision:SEMI F7-92 (Reapproved 0299) - Inactive single crystal polished silicon wafersThis standard was technically approved by the global Facilities Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee in October 1998. It was available at www. semi. org in February 1999. Originally published in 1992. NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from