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G02200 - SEMI G22 - Specification for Ceramic Pin Grid Array Packages Revision:Default Title This Test Method identifies defective

SKU: 26333397550
4.1

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Description

This Test Method identifies defective areas in crystalline silicon (Si) wafers

distributed

installation

This Test Method assumes the existence of a reliable moisture analyzer

The purpose of this Document is to establish basic physical dimensions for the carriers intended to be used to transport and ship 450 mm wafers

G02200 - SEMI G22 - Specification for Ceramic Pin Grid Array Packages Revision:Default Title This Test Method identifies defectiveThis specification defines the acceptance criteria for cofired ceramic pin grid array packages. Referenced SEMI Standards None.

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